Analysis of Conducted Immunity Test for a Signal Processing Circuit

Authors

    Hao Chen, Haibo Mi, Yiting Wang, Zhaoxuan Wang, Tianjiao Yang China Aerospace Standardization Institute, Beijing 100071, China China Aerospace Standardization Institute, Beijing 100071, China China Aerospace Standardization Institute, Beijing 100071, China China Aerospace Standardization Institute, Beijing 100071, China China Aerospace Standardization Institute, Beijing 100071, China

Keywords:

Signal processing circuit, Circuit immunity, Electromagnetic compatibility simulation

Abstract

The signal processing circuit is a traditional digital circuit, and its immunity to interference is a weak point. Through typical cases, this article starts with the conducted immunity test of the signal processing circuit. Using simulation software, electromagnetic compatibility analysis and circuit design improvements are carried out for the signal processing circuit, achieving good results. This article provides a reference for circuit designers and reliability simulation personnel.

References

Zheng F, Xu M, 2001, Principles of Signal Processing, Tsinghua University Press, Beijing.

National Standards of the People’s Republic of China, 2017, Electromagnetic Compatibility - Testing and Measurement Techniques - Immunity to Conducted Disturbances Induced by Radio-Frequency Fields, GB/T 17626.6-2017.

Su T, Tian M, Wang Q, 2014, Simulation Analysis and Optimization of PCB Electromagnetic Radiation. Chinese Journal of Electron Devices, 2014(4): 605–608.

Liu C, Long Y, 2021, Simulation Design and Analysis of a Navigation Light PCB Based on SIwave and Designer. Safety & EMC, 2021(2): 71–76.

Zhan G, 2008, Engineering Implementation of High-Performance Printed Circuit Boards. Computer Engineering, 34(9): 90–92.

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Published

2023-06-30

Issue

Vol. 1 No. 1 (2023): Signal and Information Processing

Section

Articles